Atomic force microscope systems take a tip from nanowires

(Phys.org) —In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors.

from Phys.org – spotlight science and technology news stories http://ift.tt/1tF1A8p
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